VNAPlus/ScopePlus Library

Presentations

• Optimize Performance around 60 GHz thanks to Cost-efficient Fast Source- and Load-pull using a vector network analyzer
  Speed up your design and improve your device performance by performing load-pull around 60 GHz with only your R&S network analyzer.
  (pdf - 1.1 MB)
• Using Directional Couplers to overcome the Bandwidth Limitations of IV-probes in TLP Measurements
  Renaud Gillon, Marc Vanden Bossche, Frans Verbeyst
  33rd Annual EOS/ESD Symposium, September 11-16 2011,Anaheim, CA, USA
  Replacing the IV-probes used in conventional TLP systems by directional couplers overcomes bandwidth limitations and extends the application range of the rigorous large-signal calibration technique presented previously by the authors. Transient waveforms occurring at the device-under-test are reconstructed without the distortions induced by the measurement system.
  (pdf - 770 KB)
  ... an accompanied article can be found in the articles section.
• Fast Nonlinear Device Characterization and PA Design using VNAs
  R&S Workshop in cooperation with NMDG N.V., Focus Microwaves Inc. & AWR Corporation
  European Microwave Week 2010 (EUMW), September 29th 2010, Paris, France
  
  • Device measurement in a non-50 Ohm environment using multiple harmonics
  • Extended VNAs provide realtime access to dynamic IV at multiple harmonics
  • Overview of S-functions and their role in nonlinear modeling and the downstream design processes
  • PA design using modern EDA solutions
  (zip containing pdf - 10.9 MB)
• State-of-the-art Amplifier Design by Characterization, Modeling and Simulation
  R&S - AWR - Focus - NMDG joint workshop
  5th German Microwave Conference (GeMIC 2010), March 17th 2010, Berlin, Germany
  In this workshop, you will learn about the state of the art in how to characterize the nonlinear behavior of your transistors and amplifier modules, using your regular network analyzer and tuner solutions. Now it is possible to perform small-signal, noise and large-signal measurements with a network analyzer in a non-50 Ohm environment.
  Combining a network analyzer with a harmonic tuner it is possible to visualize and measure accurately the behavior of switching amplifiers and to optimize their performance. In contrast with classic loadpull techniques, this approach gives you insight in why certain performance factors are being achieved.
  Using behavioral modeling techniques, running on the network analyzer, it is possible to use these measurements directly in a simulator to speed up the design process and to investigate behavior and performance in interaction with other components. It allows to develop more complex amplifier structures in a timely manner.
  This workshop takes you through the complete measurement, modeling and simulation cycle for amplifiers in a coherent matter. It is the result of the close cooperation and product integration of Rohde & Schwarz, NMDG, Focus Microwaves and AWR. The theory and presentations will be illustrated live during the exhibition.
  (pdf - 7.2 MB)
• The Application of Large-Signal Calibration Techniques yields Unprecedented Insight during TLP and ESD Testing
  Renaud Gillon, Marc Vanden Bossche, Frans Verbeyst
  31st Annual EOS/ESD Symposium , September 2009
  This paper presents the application of a rigorous large-signal calibration technique to TLP waveforms. In contrast to standard practice, which discards information 'hidden' in the transients, the new method allows to visualize currents and voltages occurring at the device-under-test without the distortions which render standard TLP waveforms difficult to interpret.
  (pdf - 700 KB)
  ... an accompanied article can be found in the articles section.

Articles

• Using Directional Couplers to overcome the Bandwidth Limitations of IV-probes in TLP Measurements
  Renaud Gillon, Marc Vanden Bossche, Frans Verbeyst
  33rd Annual EOS/ESD Symposium, September 11-16 2011,Anaheim, CA, USA
  Replacing the IV-probes used in conventional TLP systems by directional couplers overcomes bandwidth limitations and extends the application range of the rigorous large-signal calibration technique presented previously by the authors. Transient waveforms occurring at the device-under-test are reconstructed without the distortions induced by the measurement system.
  (pdf - 761 kB)
  ... an accompanied presentation can be found in the presentations section.
• The Application of Large-Signal Calibration Techniques yields Unprecedented Insight during TLP and ESD Testing
  Renaud Gillon, Marc Vanden Bossche, Frans Verbeyst
  31st Annual EOS/ESD Symposium , September 2009
  This paper presents the application of a rigorous large-signal calibration technique to TLP waveforms. In contrast to standard practice, which discards information 'hidden' in the transients, the new method allows to visualize currents and voltages occurring at the device-under-test without the distortions which render standard TLP waveforms difficult to interpret.
  (pdf - 331 kB)
  ... an accompanied presentation can be found in the presentations section.